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This technical report provides full detail of the round robin study charged with assessing the use of Interconnect Stress Test (IST) as a test for incoming inspection in lieu of Thermal Stress in the detection of innerlayer separations in plated-through holes. Includes background on the Post Separation Task Group, test results, round robin test plan, conclusions and test methods used.

Product Details

Published:

07/01/2001

Number of Pages:

56

File Size:

1 file , 760 KB

Product Code(s):

TR-486(D)1, TR-486(D)1