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This publication is to inform all industry participants of a unified procedure to enable consistent measurement across the industry. This document contains the measurement procedures for testing GDDR5.

This document provides the test methodology details on:

• CK and WCK Timings: tCK, tWCK, tCH/tCL, tWCKH/tWCKL, CK TJ/RJrms, CK and WCK Jitter
• CK and WCK Input Operating Conditions: VIXCK, VIXWCK, VIDCK(ac), VIDWCK(ac), VIDCK(dc),VIDWCK(dc), CKslew, and WCKslew
• Data Input Timings: tDIVW, tDIPW

Note: The procedures described in this document are intended to provide information about the tests that will be used in JEDEC GDDR5 recommended measurement parameter. This testing is not a replacement for an exhaustive test validation plan.

Product Details

Published:

2014

Number of Pages:

34

File Size:

1 file , 3 MB