Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bipolar transistors for switching applications
standard by BSI Group, 11/15/1991

Specification for cold-rolled 18/10 chromium-nickel corrosion-resisting steel sheet and strip (titanium stabilized: 800 MPa)
standard by BSI Group, 05/30/1969

Reaction-to-fire tests. Heat release, smoke production and mass loss rate. Measurement of low levels of heat release
standard by BSI Group, 01/31/2017

Rubber process fumes components. Quantitative test methods
standard by BSI Group, 10/05/2017

Quality management systems (BS EN ISO 9000:2000 series) standards and guidance boxed set
standard by BSI Group, 11/13/2002

Road vehicles. Displacement calibration method of IR-TRACC devices
standard by BSI Group, 12/17/2018

Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Sectional specification for fixed multilayer ceramic chip capacitors
standard by BSI Group, 05/01/1992

Cigarettes. Determination of loss of tobacco from the ends. Method using a vibro-bench
standard by BSI Group, 10/31/2015

Specifications for split taper pins for aeronautical purposes
standard by BSI Group, 03/30/1951

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Signal diodes, switching diodes and controlled avalanche diodes
standard by BSI Group, 11/15/1986

Specification for chromium-nickel-molybdenum corrosion-resisting steel. Bright bars and parts (540 MPa, limiting ruling section 160 mm) (Cr 17.5, Ni 12.5, Mo 2.25, controlled nitrogen content)
standard by BSI Group, 09/28/1990

Engineering drawing practice. Part 2: A guide for higher education to BS 8888:2000. Technical product documentation
standard by BSI Group, 09/11/2001