AIR-CONVECTION-COOLED, LIFE TEST ENVIRONMENT FOR LEAD-MOUNTED SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 03/01/1966

INDEX OF TERMS DEFINED IN JEDEC PUBLICATIONS
standard by JEDEC Solid State Technology Association, 05/01/2000

Potential Failure Mode and Effects Analysis (FMEA)
standard by JEDEC Solid State Technology Association, 08/01/2018

GUIDE FOR THE PRODUCTION AND ACQUISITION OF RADIATION-HARDNESS ASSURED MULTICHIP MODULES AND HYBRID MICROCIRCUITS
standard by JEDEC Solid State Technology Association, 01/01/2010

STANDARD MANUFACTURERS IDENTIFICATION CODE
standard by JEDEC Solid State Technology Association, 04/01/2009

ADDENDUM No. 4 to JESD24 – THERMAL IMPEDANCE MEASUREMENTS FOR BIPOLAR TRANSISTORS (DELTA BASE-EMITTER VOLTAGE METHOD)
Amendment by JEDEC Solid State Technology Association, 11/01/1990

Guidelines for Visual Inspection and Control of Flip Chip Type Components (FCxGA)
standard by JEDEC Solid State Technology Association, 01/01/2013

THE MEASUREMENT OF SMALL-SIGNAL VHF-UHF TRANSISTOR ADMITTANCE PARAMETERS
standard by JEDEC Solid State Technology Association, 05/01/1970

ADDENDUM No. 3 to JESD12 – CMOS GATE ARRAY MACROCELL STANDARD
Amendment by JEDEC Solid State Technology Association, 06/01/1986

MEASUREMENT OF REVERSE RECOVERY TIME FOR SEMICONDUCTOR SIGNAL DIODES
standard by JEDEC Solid State Technology Association, 07/01/1996

STANDARD MANUFACTURER'S IDENTIFICATION CODE
standard by JEDEC Solid State Technology Association, 01/01/2014

Master Trace for 128 GB SSD
Directive by JEDEC Solid State Technology Association, 07/01/2012