, Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices
standard by JEDEC Solid State Technology Association, 12/01/2015
REQUIREMENTS FOR HANDLING ELECTROSTATIC-DISCHARGE-SENSITIVE (ESDS) DEVICES
standard by JEDEC Solid State Technology Association, 12/01/1999
Mechanical Shock – Device and Subassembly
standard by JEDEC Solid State Technology Association, 06/01/2019
LOW POWER DOUBLE DATA RATE (LPDDR) SDRAM STANDARD
standard by JEDEC Solid State Technology Association, 02/01/2010
STRESS-TEST-DRIVEN QUALIFICATION OF AND FAILURE MECHANISMS ASSOCIATED WITH ASSEMBLED SOLID STATE SURFACE-MOUNT COMPONENTS
standard by JEDEC Solid State Technology Association, 06/01/2013
Graphics Double Data Rate (GDDR5X) SGRAM Standard
standard by JEDEC Solid State Technology Association, 08/01/2016
Mechanical Shock – Component and Subassembly
standard by JEDEC Solid State Technology Association, 07/01/2013
DEFINITION OF THE SSTU32S869 & SSTU32D869 REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 04/01/2007
HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)
standard by JEDEC Solid State Technology Association, 11/01/2010
HERMETICITY
standard by JEDEC Solid State Technology Association, 07/01/2001
CYCLED TEMPERATURE HUMIDITY BIAS LIFE TEST
standard by JEDEC Solid State Technology Association, 07/01/2013
ADDENDUM No. 1 to JESD12 – TERMS AND DEFINITIONS FOR GATE ARRAYS AND CELL-BASED INTEGRATED CIRCUITS
Amendment by JEDEC Solid State Technology Association, 08/01/1993