BEADED THERMOCOUPLE TEMPERATURE MEASUREMENT OF SEMICONDUCTOR PACKAGES
standard by JEDEC Solid State Technology Association, 06/01/2002

COPLANARITY TEST FOR SURFACE-MOUNT SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 01/01/2003

COPLANARITY TEST FOR SURFACE-MOUNT SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 09/01/2010

ADDENDUM No. 6 to JESD12 – INTERFACE STANDARD FOR SEMICUSTOM INTEGRATED CIRCUITS
Amendment by JEDEC Solid State Technology Association, 03/01/1991

STANDARD FOR DESCRIPTION OF 54/74ACXXXXX AND 54/74ACTXXXXX ADVANCED HIGH-SPEED CMOS DEVICES
standard by JEDEC Solid State Technology Association, 09/01/1990

RF Biased Life (RFBL) Test Method
standard by JEDEC Solid State Technology Association, 01/01/2013

Failure Mechanisms and Models for Semiconductor Devices
standard by JEDEC Solid State Technology Association, 09/01/2016

Graphics Double Data Rate (GDDR6) SGRAM Standard
standard by JEDEC Solid State Technology Association, 07/01/2018

Multi-wire Multi-level I/O Standard
standard by JEDEC Solid State Technology Association, 06/01/2016

SERIAL FLASH DISCOVERABLE PARAMETERS (SFDP)
standard by JEDEC Solid State Technology Association,

RECOMMENDED ESD-CDM TARGET LEVELS
standard by JEDEC Solid State Technology Association, 10/01/2009

ADDENDUM No. 2 to JESD24 – GATE CHARGE TEST METHOD
Amendment by JEDEC Solid State Technology Association, 01/01/1991