COPLANARITY TEST FOR SURFACE-MOUNT SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 01/01/2003

ADDENDUM No. 6 to JESD12 – INTERFACE STANDARD FOR SEMICUSTOM INTEGRATED CIRCUITS
Amendment by JEDEC Solid State Technology Association, 03/01/1991

COPLANARITY TEST FOR SURFACE-MOUNT SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 09/01/2010

STANDARD FOR DESCRIPTION OF 54/74ACXXXXX AND 54/74ACTXXXXX ADVANCED HIGH-SPEED CMOS DEVICES
standard by JEDEC Solid State Technology Association, 09/01/1990

BEADED THERMOCOUPLE TEMPERATURE MEASUREMENT OF SEMICONDUCTOR PACKAGES
standard by JEDEC Solid State Technology Association, 06/01/2002

Multi-wire Multi-level I/O Standard
standard by JEDEC Solid State Technology Association, 06/01/2016

SERIAL FLASH DISCOVERABLE PARAMETERS (SFDP)
standard by JEDEC Solid State Technology Association,

RECOMMENDED ESD-CDM TARGET LEVELS
standard by JEDEC Solid State Technology Association, 10/01/2009

ADDENDUM No. 2 to JESD24 – GATE CHARGE TEST METHOD
Amendment by JEDEC Solid State Technology Association, 01/01/1991

AND LABELING OF COMPONENTS, PCBs AND PCBAs TO IDENTIFY LEAD (Pb), Pb-FREE AND OTHER ATTRIBUTES
standard by JEDEC Solid State Technology Association, 02/01/2011

Notification Standard for Product Discontinuance
standard by JEDEC Solid State Technology Association, 11/01/2014

RF Biased Life (RFBL) Test Method
standard by JEDEC Solid State Technology Association, 01/01/2013