QUALITY SYSTEM ASSESSMENT
standard by JEDEC Solid State Technology Association, 10/01/2013

STANDARD FOR DESCRIPTION OF 3.3 V NFET BUS SWITCH DEVICES WITH INTEGRATED CHARGE PUMPS
standard by JEDEC Solid State Technology Association, 08/01/2001

SERIAL FLASH RESET SIGNALING PROTOCOL
standard by JEDEC Solid State Technology Association, 10/01/2018

1.0 V +/- 0.1 V (NORMAL RANGE) AND 0.7 V – 1.1 V (WIDE RANGE) POWER SUPPLY VOLTAGE AND INTERFACE STANDARD FOR NONTERMINATED DIGITAL INTEGRATED CIRCUITS
standard by JEDEC Solid State Technology Association, 09/01/2007

A PROCEDURE FOR EXECUTING SWEAT
standard by JEDEC Solid State Technology Association, 08/01/2003

Implementation of the Electrical Test Method for the Measurement of Real Thermal Resistance and Impedance of Light-emitting Diodes with Exposed Cooling Surface
standard by JEDEC Solid State Technology Association, 04/18/2012

MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE
standard by JEDEC Solid State Technology Association, 07/01/1972

FIELD-INDUCED CHARGED-DEVICE MODEL TEST METHOD FOR ELECTROSTATIC DISCHARGE WITHSTAND THRESHOLDS OF MICROELECTRONIC COMPONENTS
standard by JEDEC Solid State Technology Association, 12/01/2009

LOW FREQUENCY POWER TRANSISTORS
standard by JEDEC Solid State Technology Association, 01/01/1976

RELIABILITY QUALIFICATION OF SEMICONDUCTOR DEVICES BASED ON PHYSICS OF FAILURE RISK AND OPPORTUNITY ASSESSMENT
standard by JEDEC Solid State Technology Association, 01/01/2014

Thermal Test Chip Guideline (Wire Bond Type Chip)
standard by JEDEC Solid State Technology Association, 06/01/2019

MEASURING WHISKER GROWTH ON TIN AND TIN ALLOY SURFACE FINISHES
standard by JEDEC Solid State Technology Association, 07/01/2008