RECOMMENDED PRACTICE FOR MEASUREMENT OF TRANSISTOR LEAD TEMPERATURE
standard by JEDEC Solid State Technology Association, 06/01/2004
COMMON FLASH INTERFACE (CFI) IDENTIFICATION CODES
standard by JEDEC Solid State Technology Association, 05/01/2004
SEMICONDUCTOR WAFER AND DIE BACKSIDE EXTERNAL VISUAL INSPECTION
standard by JEDEC Solid State Technology Association, 03/01/2011
Thermal Test Chip Guideline (Wire Bond Type Chip)
standard by JEDEC Solid State Technology Association, 06/01/2019
MEASURING WHISKER GROWTH ON TIN AND TIN ALLOY SURFACE FINISHES
standard by JEDEC Solid State Technology Association, 07/01/2008
STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS
standard by JEDEC Solid State Technology Association, 08/01/2018
STANDARD FOR DESCRIPTION OF 3867 – 2.5 V, SINGLE 10-BIT, 2-PORT, DDR FET SWITCH
standard by JEDEC Solid State Technology Association, 11/01/2001
TRANSIENT VOLTAGE SUPPRESSOR STANDARD FOR THYRISTOR SURGE PROTECTIVE DEVICE
standard by JEDEC Solid State Technology Association, 11/01/1999
THERMAL RESISTANCE TEST METHOD FOR SIGNAL AND REGULATOR DIODES (FORWARD VOLTAGE, SWITCHING METHOD)
standard by JEDEC Solid State Technology Association, 07/01/1986
ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST
standard by JEDEC Solid State Technology Association, 08/01/2018
SALT ATMOSPHERE
standard by JEDEC Solid State Technology Association, 01/01/2004
DDR4 DATA BUFFER DEFINITION (DDR4DB01)
standard by JEDEC Solid State Technology Association,