ADDENDUM No. 6 to JESD24 – THERMAL IMPEDANCE MEASUREMENTS FOR INSULATED GATE BIPOLAR TRANSISTORS
Amendment by JEDEC Solid State Technology Association, 10/01/2001

PROCUREMENT STANDARD FOR KNOWN GOOD DIE (KGD)
standard by JEDEC Solid State Technology Association, 09/01/2005

MEASUREMENT OF TEMPERATURE COEFFICIENT OF VOLTAGE REGULATOR DIODES
standard by JEDEC Solid State Technology Association, 02/01/1982

DDR4 REGISTER CLOCK DRIVER (DDR4RCD01)
standard by JEDEC Solid State Technology Association, 08/01/2016

FOUNDRY PROCESS QUALIFICATION GUIDELINES (Wafer Fabrication Manufacturing Sites)
standard by JEDEC Solid State Technology Association, 02/01/2014

TEST PROCEDURE FOR THE MANAGEMENT OF SINGLE-EVENT EFFECTS IN SEMICONDUCTOR DEVICES FROM HEAVY ION IRRADIATION
standard by JEDEC Solid State Technology Association, 12/01/1996

MECHANICAL SHOCK
standard by JEDEC Solid State Technology Association, 11/01/2004

UNIVERSAL FLASH STORAGE (UFS) SECURITY EXTENSION
standard by JEDEC Solid State Technology Association, 11/01/2016

POD12-1.2 V Pseudo Open Drain Interface
standard by JEDEC Solid State Technology Association, 08/01/2011

STANDARD FOR DESCRIPTION OF 2.5 V CMOS LOGIC DEVICES
standard by JEDEC Solid State Technology Association, 11/01/1999

SOLDER BALL PULL
standard by JEDEC Solid State Technology Association, 05/01/2007

SUBASSEMBLY MECHANICAL SHOCK
standard by JEDEC Solid State Technology Association, 11/01/2004