JEDEC JESD6 (R2002)
September 11, 2020
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This standard gives a test method for measuring transistor capacitance using a three-terminal bridge which employs a guard-circuit that eliminates the effect of extraneous capacitance.
Product Details
- Published:
- 02/01/1967
- Number of Pages:
- 17
- File Size:
- 1 file , 280 KB