JEDEC JESD6 (R2002)

September 11, 2020 by No Comments

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This standard gives a test method for measuring transistor capacitance using a three-terminal bridge which employs a guard-circuit that eliminates the effect of extraneous capacitance.

Product Details

Published:
02/01/1967
Number of Pages:
17
File Size:
1 file , 280 KB